UTAMURADOV, Sh.B.; DALIEV, Sh.Kh.; RAKHMANOV, D.A.; DOROSHKEVICH, A.S.; GENOV, I.G.; TUAN, P.L.; KIRILLOV, A.K. PROCESSES OF DEFECT FORMATION IN SILICON DIFFUSIONALLY DOPED WITH PLATINUM AND IRRADIATED WITH PROTONS. Eurasian Physical Technical Journal, [S. l.], v. 20, n. 3(45), p. 35–42, 2023. DOI: 10.31489/2023No3/35-42. Disponível em: https://phtj.buketov.edu.kz/EPTJ/article/view/766. Acesso em: 1 apr. 2026.