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• AUTOMATED MEASURING SYSTEM FOR INVESTIGATING TEMPERATURE DEPENDENCE OF LOW-FREQUENCY NOISE SPECTRA IN ELECTRONIC ELEMENTS AND STRUCTURES

  • A.V. Ermachikhin
  • V.G. Litvinov
  • T.A. Kholomina
  • A.D. Maslov
  • E.P. Trusov

  51-57

  2022-12-01

  Abstract views: 1809 / PDF downloads: 463