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AUTOMATED MEASURING SYSTEM FOR INVESTIGATING TEMPERATURE DEPENDENCE OF LOW-FREQUENCY NOISE SPECTRA IN ELECTRONIC ELEMENTS AND STRUCTURES
- A.V. Ermachikhin
- V.G. Litvinov
- T.A. Kholomina
- A.D. Maslov
- E.P. Trusov
51-57

2022-12-01
Abstract views: 1345 / PDF downloads: 420

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